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X11 - Nanobeam Diffraction and 4DSTEM Analysis of Crystalline and Disordered Materials
Separate registration required — Registration information coming January 2026.
INCLUDED IN REGISTRATION FEE:
Breakfast, Lunch, AM & PM Coffee Breaks
PROGRAM ORGANIZERS:
- Colin Ophus, Stanford University'
- Stephanie Ribet, Lawrence Berkeley National Laboratory
- Ian MacLaren, University of Glasgow
Description:
- Practical guidance for acquiring nanobeam diffraction data, including probe conditions, signal-to-noise, and camera parameters
- Loading, organizing, and calibrating 4DSTEM data across formats, with tools for disk detection, preprocessing, and ML-based analysis
- Virtual imaging approaches: bright/dark field reconstructions, digital dark field, and phase/domain mapping
- Diffraction analysis of crystalline samples: strain mapping, orientation mapping, and phase identification
- Diffraction analysis of disordered or semicrystalline materials: polymer orientation, phase mapping, and pair distribution functions.