Sunday Short Courses

Sunday Short Courses

Sunday, July 28, 2024 | 8:30 am - 5:00 pm

Included in registration: AM & PM Coffee Breaks & Boxed Lunch

X-10 Guidelines for Performing 4D-STEM Characterization from the Atomic to Micrometer Scales: Experimental Considerations, Data Analysis


Colin Ophus, Lawrence Berkeley National Laboratory
David Muller, Cornell University

  • Electron detector technology suitable for 4D-STEM experiments
  • List of possible 4D-STEM experimental configurations and references
  • Analysis software for characterizing large numbers of STEM diffraction pattern images and visualization of the results
  • Software and tutorial for simulating 4D-STEM datasets

X-11 Cryo-EM for Materials Sciences: Hardware, Applications and Data Acquisition


Ismail El Baggari, Harvard University
Myung-Geun Han, Brookhaven National Laboratory
Michael Zachman, Oak Ridge National Laboratory

While cryogenic TEM has revolutionized research in biological science, its applications in materials sciences have been relatively limited. The major challenges lie in realizing reliable cryogenic specimen preparation, and atomic-scale imaging and spectroscopy at a wide range of cryogenic temperatures. Though still in its infancy, recent advancements in cryo-EM, especially in cryo-FIB and new TEM stages, have brought us the promises.

 This short course will focus on the fundamentals of cryo-EM and primarily benefit those new to the field. We will highlight historical developments, current state, and future perspectives of cryo-EM for materials science. We will cover critical steps involved in a successful cryogenic microscopy study, including specimen preparation, specimen transfer, cryogenic FIB, new cryo-TEM stages, imaging, spectroscopy at low temperatures, and data analysis methods that can potentially be used to assist cryo-EM data acquisition and data analysis.

X-12 Transmission Electron Microscopy and Spectroscopy from First Principles


Toma Susi, University of Vienna, Austria
Jacob Madsen, University of Vienna, Austria
Paul Zeiger, Uppsala University, Sweden
Thomas Ginnis, University of Oxford, United Kingdom

Simulations of transmission electron microscopy images and electron energy-loss spectra can not only be vital for correctly interpreting and understanding measured data, but may also be used to design experiments or even instrumentation. With modern open-source tools, simulations of all kinds of image signals including HRTEM, ED, DPC and 4D-STEM are easy to learn and tractable on a personal computer. Computational exercises are performed using the open-source Python package abTEM. Simulation of electron energy-loss spectra is more demanding, and requires specialized expertise and high-performance computing resources. Different approaches to model phonon, plasmon and core-loss spectra are introduced, including a limited exercise.

  • (Scanning) transmission electron microscopy image simulations
  • Introduction to open-source TEM simulation software
  • Computational exercises for modeling common imaging modes
  • First-principles simulation of electron energy-loss spectroscopy
  • Introduction to principles of phonon, low-loss and core-loss modeling

X-13 Automated Experiments in Electron Microscopy


Sergei Kalinin, University of Tennessee
Maxim Ziatdinov, Oak Ridge National Laboratory
Kevin Roccapriore, Oak Ridge National Laboratory

  • Machine learning driven design of workflows in electron microscopy and spectroscopy based on the chosen experimental objective
  • Myopic and non-myopic workflows: rewards, policies, and value functions—neural networks for real time data analysis in EM
  • Structured Gaussian Processes and deep kernel learning: co-discovery of physical mechanisms and optimization—from myopic optimization to reinforcement learning

X-14 From Obscure to Clear: A Dive into Tissue Clearing and Expansion Microscopy


Yongxin (Leon) Zhao, Carnegie Mellon University
Alan Watson, University of Pittsburgh
Adam Glaser, Allen Institute
Aleksandra Klimas, Carnegie Mellon University

  • Foundations of Tissue Clearing: Understanding the basics and significance.
  • Tissue Clearing Methods: Exploring popular techniques and essential reagents.
  • Expansion Microscopy and variants: Delving into principles, different variants and applications. 

X-15 Focused Ion Beam Theory & Methods


Lucille Gianuzzi, EXpressLO, LLC
Joseph Michael, Sandia National Laboratories (Ret.)

The use of FIB instruments in materials- and biological-science laboratories is growing rapidly. The versatility and capabilities of these tools are also rapidly improving. This course will first cover ion/solid interactions, which must be understood for successful application of these tools. The attendees will learn of the variety of commercial ion sources and ion species available in FIB instruments, and explore their benefits for a range of applications. Applications of femtosecond laser micromachining in conjunction with FIB will be discussed. Techniques of sample preparation for SEM and TEM, 3D applications, micro- and nano-fabrication and cryo-methods will be presented.

  • Theory of ion-solid interactions
  • A review of ion sources: LMIS (Ga and others), PFIB (Xe and others), and other commercial ion sources.
  • 2D and 3D (FIB SEM tomography) sample preparation
  • TEM and APT specimen preparation
  • Cryo FIB TEM specimen preparation
  • Micro and nano-fabrication using ion beams