Tutorials

Tutorials

Physical Sciences Tutorials

X40 - Transmission Kikuchi Diffraction Hardware, Sample Preparation and Data Acquisition

Organizer: Sriram Vijayan, Assistant Professor,  Department of Materials Science & Engineering, Michigan Technological University

Speaker: Donovan N. Leonard, PhD.

Transmission Kikuchi Diffraction (TKD) has emerged as a powerful technique for nanoscale crystallographic characterization, offering spatial resolution an order of magnitude better than conventional EBSD while leveraging instrumentation already available in many SEM laboratories. Despite its growing use, successful TKD implementation requires careful attention to instrumentation, specimen preparation, acquisition strategies, and data interpretation.

This tutorial provides a comprehensive and practical introduction to TKD, covering the entire workflow from sample selection through data analysis. Participants will learn how detector geometry, SEM operating conditions, and specimen preparation methods influence pattern quality and indexing performance. Common challenges—including low pattern quality, failed indexing, specimen thickness effects, contamination, drift, and detector limitations—will be discussed alongside proven troubleshooting strategies.

Through numerous real-world case studies, attendees will see how TKD can be applied to address challenging materials characterization problems, including:

  • Nanocrystalline metals and ultra-fine grained alloys
  • Additive manufacturing materials
  • Advanced structural materials
  • Deformation and recrystallization studies
  • Correlative TKD-STEM characterization workflows
  • Site-specific FIB prepared specimens

The course will compare electropolishing and focused ion beam (FIB) lift-out approaches, highlighting the strengths and limitations of each method. Practical guidance will be provided for laboratories seeking to implement TKD using existing EBSD hardware as well as those considering dedicated system upgrades.

Attendees will leave with a clear understanding of how to prepare successful TKD specimens, acquire high-quality diffraction data, troubleshoot common failures, and apply TKD to solve complex microstructural characterization challenges.

X42 - A Practical Guide to Electron Channeling Contrast Imaging

Organizer: Sriram Vijayan, Assistant Professor,  Department of Materials Science & Engineering, Michigan Technological University

Speaker: Julia Dietz, Principal R&D Staff, Sandia National Laboratory

This tutorial will cover the following topics:

  • The basics of obtaining defect imaging with ECCI
  • Considerations and solutions for polycrystalline samples
  • G·b analysis
  • Recent developments and future directions

Biological Tutorial

X41 - Harmonizing Electron Microscopy Sample Preparation: Advances in Automated Sample Preparation

Organizers: 

  • Melainia McClain, B.A., Stowers Institute for Medical Research
  • Aydin M. Medina-Lopez, Ph.D., Ronawk
  • Lexi S. Simar, Ph.D., Columbia University in the City of New York

This tutorial presents an initiative to develop a harmonized workflow for electron microscopy (EM) sample preparation using automated tissue processors and microwave-assisted processing. Compared with manual methods, automated processors offer significant advantages, including programmable reagent exchange, controlled agitation, and consistent timing, thereby reducing operator variability and improving reproducibility across laboratories. Microwave systems can complement this approach by accelerating fixation, decalcification, and resin polymerization through controlled, low-temperature energy delivery, enabling substantial reductions in processing time while maintaining ultrastructural quality. Despite these benefits, challenges remain: automated processors may have limited flexibility for unconventional specimens, and microwave protocols require careful optimization to avoid uneven heating or artifacts.

This tutorial addresses these considerations by providing practical guidance, troubleshooting strategies, and tips for integrating protocols. Together, these technologies support greater harmonization in EM sample preparation, enabling more standardized, efficient, and high-quality workflows suitable for both research and diagnostic applications.

X43 - Don’t Break the Ice!

Organizers: 

  • Brock Summers, Ph.D., Washington University in Saint Louis School of Medicine, Center for Cellular Imaging
  • Katherine Basore, Ph.D., Washington University in Saint Louis School of Medicine, Center for Cellular Imaging
  • Brad Readnour, Ph.D. Washington University in Saint Louis School of Medicine, Center for Cellular Imaging

Effective planning and evaluation during early cryogenic?electron microscopy (cryo?EM) screening are critical for determining whether a specimen is suitable for high?resolution data collection.

This tutorial provides a practical framework for selecting appropriate grid types, identifying key features to assess during initial screening, and evaluating sample integrity, particle distribution, and overall readiness for downstream data acquisition.

Drawing on extensive experience with diverse preclinical and clinical specimens, experts from the Washington University Center for Cellular Imaging (WUCCI) outline decision?making strategies that streamline grid preparation, ice assessment, early?stage troubleshooting, and related tasks.

Participants will receive guidance on recognizing indicators of successful data collection, improving session efficiency, and avoiding common pitfalls—ensuring their imaging workflow begins on solid, well?frozen ground. Lesson number one: don’t break the ice!