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X13 - SEM, EPMA, EDS, and WDS Best Practices for Quantitative Microanalysis
Separate registration required — Registration information coming January 2026.
INCLUDED IN REGISTRATION FEE:
Breakfast, Lunch, AM & PM Coffee Breaks
PROGRAM ORGANIZERS:
- John Donovan, Probe Software
- Glenn Poirier, Canadian Museum of Nature
- Heather Lowers, US Geological Survey
- Will Nachlaws, University of Wisconsin-Madison
- Mike Matthews, AWE, United Kingdom
- Joseph Robert Boro, Lawrence Livermore National Laboratory
Topics within this Short Course will include:
- Introduction to SEM/EPMA best practices, major, minor and trace elements
- Introduction to EDS with standards, sample navigation, point/area re-location on other instruments
- Designing analytical strategies, setups, standard selection, WDS, and EDS spectrometer choices, analyzed vs. unanalyzed elements
- Correction of data, e.g., background, dead time, intensity/beam drift, matrix effects, low Z elements (peak shape/shift effects)
- Correction of artifacts, e.g., spectral interferences, blank corrections, beam sensitive samples/carbon contamination, secondary boundary fluorescence
- Quantitative mapping
- Analytical output, display/plotting, detection limits, reporting.