X61 - Atom Probe Tomography User's Meeting and Workshop Professionals in Microscopy and Microanalysis

X61 - Atom Probe Tomography User's Meeting and Workshop Professionals in Microscopy and Microanalysis

Organized by the Microscopy Society of America Atom Probe Field Ion Microscopy Focused Interest Group (APFIM)


Sunday, August 2, 2026 • 8:30 AM - 5:30 PM

Separate registration required — see Registration Page 

INCLUDED IN REGISTRATION FEE:
Breakfast, Lunch, AM and PM Coffee Breaks

PROGRAM ORGANIZERS:

  • Steve Foldvari, Amatek / Gatan
  • Simon Ringer, University of Sydney, Australia
  • Kay Song, University of Sydney, Australia
  • Kayla Yano, Pacific Northwest National Laboratory

This APT User's Meeting and workshop will facilitate technical presentations, small group discussions and technology updates from the APT community. Topics will include correlative microscopies (e.g. APTS/TEM, TKD, etc.) and practical use of the latest analysis algorithms from AP Suite and external software extensions. High impact work aligned with these topics (e.g. Critical Minerals Research, and AI-Driven Reconstruction and Analysis) will be reviewed with the theme of, "Things I learned on the way to succeeding".