X30 - Technologists' Forum Symposia: Exploring New Methods in Volume Electron Microscopy (vEM) [Partnering with B09]
Speakers:
Naomi Kamasawa, Max Planck Florida Institute for Neuroscience
Challenges of Sample Preparations for vEM-CLEM
Joseph Sall, NYU Langone Health, NYU Grossman School of Medicine
Strategies for Optimizing SBF-SEM Imaging of Biological Samples
Mark Marsh, Comet Technologies Canada
Image Analysis of vEM Data using Dragon Fly
Organizers:
D. Page Baluch, Arizona State University
Alice Liang, NYU Grossman School of Medicine
Advancements in volume electron microscopy are improving high resolution visualization of 3D cellular structures at a nanometer scale. Efforts to optimize and improve this data relies on optimal sample preparation and high-level image analysis. This year the Technologists’ Forum is partnering with the organizers of the Volume electron Microscopy [B09] symposium to provide a series of presentations that will focus on the development of new protocols to optimize sample preparation and analysis obtained from various imaging platforms.
- Biological sample preparation for vEM
- Exploring multimodal imaging techniques
- Large data management and analysis
X31 - Technologists' Forum Symposium: SubAngstrom Room Design and Lab Space Optimization - CANCELLED
X32 - Technologists' Forum Roundtable: Tips for Managing an EM Lab
Organizer: D. Page Baluch, Assistant Director of Biosciences Core Facilities, Arizona State University
Moderator: Frank Macaluso, Administrative Director of Electron Microscopy, Analytical Imaging Facility, Albert Einstein College of Medicine
Panelists:
- Lee Cohen-Gould, Senior Director, Microscopy & Image Analysis Core, Weill Cornell Medicine
- Ru-Ching Hsia, Director, Electron Microscopy Laboratory, Frederick National Laboratory for Cancer Research
- Richard Martens, Program Manager, Air Force Research Laboratory, Materials and Manufacturing Directorate, Materials Characterization Facility, Wright-Patterson AFB & UES, a BlueHalo Company
- Steven Goodman, Chief Scientific Officer, Microscopy Innovations
- Joe Mowery, Life Science EM/XRM Sales Specialist, Zeiss Microsystems
Electron Microscopy laboratories rely on optimized lab management by well-trained managers and technologists. This symposium will focus on key areas that help improve lab proficiency and image quality by reviewing many common lab protocols that are essential to a productive lab.
- Lab safety and standardizing SOPs
- Sample prep and realistic expectations for CLEM
- Avoiding TEM/SEM contamination
- Hazardous waste management
- Guidelines for training new users