Technologists’ Forum

Technologists’ Forum

X30 - Technologists' Forum Symposia: Exploring New Methods in Volume Electron Microscopy (vEM) [Partnering with B09]

Naomi Kamasawa, Max Planck Florida Institute for Neuroscience
Challenges of Sample Preparations for vEM-CLEM

Joseph Sall, NYU Langone Health, NYU Grossman School of Medicine
Strategies for Optimizing SBF-SEM Imaging of Biological Samples

Mark Marsh, Comet Technologies Canada
Image Analysis of vEM Data using Dragon Fly


D. Page Baluch, Arizona State University
Alice Liang, NYU Grossman School of Medicine

Advancements in volume electron microscopy are improving high resolution visualization of 3D cellular structures at a nanometer scale. Efforts to optimize and improve this data relies on optimal sample preparation and high-level image analysis. This year the Technologists’ Forum is partnering with the organizers of the Volume electron Microscopy [B09] symposium to provide a series of presentations that will focus on the development of new protocols to optimize sample preparation and analysis obtained from various imaging platforms. 

  • Biological sample preparation for vEM
  • Exploring multimodal imaging techniques
  • Large data management and analysis

X31 - Technologists' Forum Symposium: SubAngstrom Room Design  and Lab Space Optimization - CANCELLED


X32 - Technologists' Forum Roundtable: Tips for Managing an EM Lab

Lee Cohen-Gould, Weill Cornell Medicine 
Ru-Ching Hsia, Frederick National Laboratory for Cancer Research
Richard Martens, UES, Materials Characterization Facility, Wright-Patterson AFB
Steven Goodman, Microscopy Innovations

Moderator: John Grazul, Cornell Center for Materials Research

Organizer: D. Page Baluch, Arizona State University

Electron Microscopy laboratories rely on optimized lab management by well-trained managers and technologists. This symposium will focus on key areas that help improve lab proficiency and image quality by reviewing many common lab protocols that are essential to a productive lab. 

  • Lab safety and standardizing SOPs
  • Sample prep and realistic expectations for CLEM
  • Avoiding TEM/SEM contamination
  • Hazardous waste management
  • Guidelines for training new users